IEEE - CAS Bangalore Chapter, India     CAS Chapter - Region 10
Institute of Electrical and Electronics Engineers - Circuits and Systems Society
Goals: To conduct seminars, workshops, and other events pertaining to all aspects of electronic circuits and systems

One-day Workshop on Aspects of Analog and RF Test

Date: October 31, 2015
Venue: Texas Instruments India, Bagmane Tech Park, CV Raman Nagar, Bangalore
Organized by IEEE Circuits and Systems Society, Bangalore Chapter, In cooperation with IEEE Bangalore Section and Texas Instruments, India
A One-day Workshop on Aspects of Analog and RF Test ... Report
Speakers (from TI India): Sharat Chandra, Sankar Sadasivam, Harikrishna Parthasarathy, Rittu Sachedev and Anil Kumar

Anil Kumar, TI India
Anil Kumar (TI India) delivered the opening talk and provided an overview of "The challenges in the Validation and Testing of Analog/RF circuits"


Sharat Chandra, TI India
Sharat Chandra (TI India) delivers a talk on "Testing of Data Converters"


Sharat Chandra, TI India
 


Sharat Chandra, TI India
 


Sankar Sadasivam, TI India
Sankar Sadasivam (TI India) delivers a lecture on "System-level aspects of Analog / RF Test"


Sankar Sadasivam, TI India
 


Rittu Sachedev, TI India
Rittu Sachedev, TI India delivers a talk on "Test aspects of RF Design"



About 30 participants took part in the workshop on Aspects of Analog/RF Test organized by IEEE CAS



 



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