IEEE - CAS Bangalore Chapter, India CAS Chapter - Region 10
Institute of Electrical and Electronics Engineers - Circuits and Systems Society
Goals: To conduct seminars, workshops, and other events pertaining to all aspects of electronic circuits and systems
One-day Workshop on Aspects of Analog and RF Test
Date: October 31, 2015 Venue: Texas Instruments India, Bagmane Tech Park, CV Raman Nagar, Bangalore Organized by IEEE Circuits and Systems Society, Bangalore Chapter, In cooperation with IEEE Bangalore Section and Texas Instruments, India
A One-day Workshop on Aspects of Analog and RF Test ... Report Speakers (from TI India): Sharat Chandra, Sankar Sadasivam, Harikrishna Parthasarathy, Rittu Sachedev and Anil Kumar
Anil Kumar (TI India) delivered the opening talk and provided an overview of "The challenges in the Validation and Testing of Analog/RF circuits"
Sharat Chandra (TI India) delivers a talk on "Testing of Data Converters"
Sankar Sadasivam (TI India) delivers a lecture on "System-level aspects of Analog / RF Test"
Rittu Sachedev, TI India delivers a talk on "Test aspects of RF Design"
About 30 participants took part in the workshop on Aspects of Analog/RF Test organized by IEEE CAS