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IEEE - CAS Bangalore Chapter, India     CAS Chapter - Region 10
Institute of Electrical and Electronics Engineers - Circuits and Systems Society
Goals: To conduct seminars, workshops, and other events pertaining to all aspects of electronic circuits and systems
Seminar on
BIST for High-Quality and Low-Cost Testing



Date: 10 January 2018 ... Report
Venue: Texas Instruments India, Bangalore Campus
Organized by: IEEE CAS Bangalore Chapter, in cooperation with Texas Instruments (India) and IEEE Bangalore Section
Seminar on BIST for High-Quality and Low-Cost Testing by Sule Ozev (Asc.Prof, Arizona State University)


Sule Ozev (Asc.Prof, Arizona State University)
Sule Ozev (Asc.Prof, Arizona State University)



 



 



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